Re: [PATCH 3/4] dinput8/tests: Make overlapped format test more robust.

[Marvin]

Hi,

While running your changed tests, I think I found new failures.
Being a bot and all I'm not very good at pattern recognition, so I might be
wrong, but could you please double-check?

Full results can be found at:
https://testbot.winehq.org/JobDetails.pl?Key=94475

Your paranoid android.


=== w7u_2qxl (32 bit report) ===

dinput8:
device.c:866: Test failed: Expected 1 element, received 0
device.c:870: Test failed: Expected DIK_SPACE key state down
device.c:878: Test failed: Expected 1 element, received 0
device.c:893: Test failed: Expected key 0 state down