Re: [PATCH 10/10] dxgi/tests: Remove leftover debug comment.

[Marvin]

Hi,

While running your changed tests on Windows, I think I found new failures.
Being a bot and all I'm not very good at pattern recognition, so I might be
wrong, but could you please double-check?
Full results can be found at
https://testbot.winehq.org/JobDetails.pl?Key=16696

Your paranoid android.


=== w1064 (32 bit device) ===
device.c:1134: Test failed: Got unexpected hr 0, test 16.
device.c:1134: Test failed: Got unexpected hr 0x87a0001, test 39.

=== w1064 (64 bit device) ===
device.c:1134: Test failed: Got unexpected hr 0, test 16.
device.c:1188: Test failed: Got usage 160, expected 60, test 28, buffer 1.
device.c:1188: Test failed: Got usage 160, expected 60, test 29, buffer 2.
device.c:1188: Test failed: Got usage 160, expected 60, test 35, buffer 1.
device.c:1188: Test failed: Got usage 160, expected 60, test 36, buffer 2.
device.c:1134: Test failed: Got unexpected hr 0, test 39.
device.c:1188: Test failed: Got usage 160, expected 60, test 41, buffer 15.
device.c:1188: Test failed: Got usage 160, expected 60, test 42, buffer 15.