[PATCH 1/1] dwrite/tests: Avoid stack-use-after-scope in test_GetOverhangMetrics. (ASan)

[Bernhard Übelacker]

From: Bernhard Übelacker

---
 dlls/dwrite/tests/layout.c | 2 +-
 1 file changed, 1 insertion(+), 1 deletion(-)

diff --git a/dlls/dwrite/tests/layout.c b/dlls/dwrite/tests/layout.c
index f8ca4f250c4..d8e69a4f17e 100644
--- a/dlls/dwrite/tests/layout.c
+++ b/dlls/dwrite/tests/layout.c
@@ -6239,6 +6239,7 @@ static void test_GetOverhangMetrics(void)
     IDWriteTextLayout *layout;
     HRESULT hr;
     UINT32 i;
+    struct test_inline_obj obj;

factory = create_factory();

@@ -6254,7 +6255,6 @@ static void test_GetOverhangMetrics(void)
         DWRITE_OVERHANG_METRICS overhang_metrics;
         DWRITE_TEXT_RANGE range = { 0, 1 };
         DWRITE_TEXT_METRICS metrics;
-        struct test_inline_obj obj;

test_inline_obj_init(&obj, &test->metrics, &test->overhang_metrics);